» Articles » PMID: 20867408

Surface Band-gap Narrowing in Quantized Electron Accumulation Layers

Overview
Journal Phys Rev Lett
Specialty Biophysics
Date 2010 Sep 28
PMID 20867408
Citations 9
Authors
Affiliations
Soon will be listed here.
Abstract

An energy gap between the valence and the conduction band is the defining property of a semiconductor, and the gap size plays a crucial role in the design of semiconductor devices. We show that the presence of a two-dimensional electron gas near to the surface of a semiconductor can significantly alter the size of its band gap through many-body effects caused by its high electron density, resulting in a surface band gap that is much smaller than that in the bulk. Apart from reconciling a number of disparate previous experimental findings, the results suggest an entirely new route to spatially inhomogeneous band-gap engineering.

Citing Articles

Spatially resolved random telegraph fluctuations of a single trap at the Si/SiO interface.

Cowie M, Constantinou P, Curson N, Stock T, Grutter P Proc Natl Acad Sci U S A. 2024; 121(44):e2404456121.

PMID: 39446387 PMC: 11536084. DOI: 10.1073/pnas.2404456121.


High-energy photoemission final states beyond the free-electron approximation.

Strocov V, Lev L, Alarab F, Constantinou P, Wang X, Schmitt T Nat Commun. 2023; 14(1):4827.

PMID: 37563126 PMC: 10415355. DOI: 10.1038/s41467-023-40432-5.


Band Structure Extraction at Hybrid Narrow-Gap Semiconductor-Metal Interfaces.

Schuwalow S, Schroter N, Gukelberger J, Thomas C, Strocov V, Gamble J Adv Sci (Weinh). 2021; 8(4):2003087.

PMID: 33643798 PMC: 7887586. DOI: 10.1002/advs.202003087.


Three-dimensional band structure and surface electron accumulation of rs-CdZnO studied by angle-resolved photoemission spectroscopy.

Takahashi K, Imamura M, Chang J, Tanaka T, Saito K, Guo Q Sci Rep. 2019; 9(1):8026.

PMID: 31142755 PMC: 6541624. DOI: 10.1038/s41598-019-44423-9.


Two-dimensional electronic transport and surface electron accumulation in MoS.

Siao M, Shen W, Chen R, Chang Z, Shih M, Chiu Y Nat Commun. 2018; 9(1):1442.

PMID: 29650960 PMC: 5897365. DOI: 10.1038/s41467-018-03824-6.