Luis Rogerio de Oliveira Hein
Overview
Explore the profile of Luis Rogerio de Oliveira Hein including associated specialties, affiliations and a list of published articles.
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Articles
9
Citations
6
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Recent Articles
1.
Rovetta-Nogueira S, Borges A, Oliveira Filho M, Castaldelli Nishime T, Hein L, Kostov K, et al.
Molecules
. 2023 Dec;
28(23).
PMID: 38067648
(1) Background: Previous studies reported the promising inhibitory effect of cold atmospheric plasma (CAP) on . However, the exact mechanisms of CAP's action on the fungal cell are still poorly...
2.
Kodaira F, Almeida A, Tavares T, Quade A, Hein L, Kostov K
Polymers (Basel)
. 2023 Aug;
15(16).
PMID: 37631400
Although atmospheric pressure plasma jets (APPJs) have been widely employed for materials modification, they have some drawbacks, such as the small treatment area (couple of cm). To overcome this limitation,...
3.
Kodaira F, Leal B, Tavares T, Quade A, Hein L, Chiappim W, et al.
Polymers (Basel)
. 2023 Jan;
15(2).
PMID: 36679342
A conical-shaped atmospheric pressure plasma jet (CS-APPJ) was developed to overcome a standard limitation of APPJs, which is their small treatment area. The CS-APPJs increase the treatment area but use...
4.
Oliveira Filho M, de Jesus M, Nakazato A, Kondo M, Hein L
HardwareX
. 2022 Oct;
12:e00362.
PMID: 36204425
Extruders are necessary equipment for 3D filament manufacturing, which is considered a clean technology because it has less scrap and can reuse materials, increasing its life cycle. Open source extruders...
5.
Hein L, de Oliveira J, de Campos K
Microsc Res Tech
. 2013 Jul;
76(9):909-13.
PMID: 23813591
The correlative light-electron fractography technique combines correlative microscopy concepts to the extended depth-from-focus reconstruction method, associating the reliable topographic information of 3-D maps from light microscopy ordered Z-stacks to the...
6.
Hein L, de Oliveira J, de Campos K
Microsc Microanal
. 2013 Feb;
19(2):496-500.
PMID: 23402567
Correlative fractography is a new expression proposed here to describe a new method for the association between scanning electron microscopy (SEM) and light microscopy (LM) for the qualitative and quantitative...
7.
Hein L, de Oliveira J, de Campos K, Caltabiano P
Microsc Res Tech
. 2012 Jul;
75(11):1593-607.
PMID: 22807203
In this work, NIH ImageJ plugins for extended depth-from-focus reconstructions (EDFR) based on spatial domain operations were compared and tested for usage optimization. Also, some preprocessing solutions for light microscopy...
8.
Hein L, de Campos K, Caltabiano P
Micron
. 2012 May;
43(10):1039-49.
PMID: 22595459
Uncoated fracture surfaces of carbon-epoxy composites are investigated using a variable-pressure environmental scanning electron microscope (VP-ESEM), under optimized conditions for topographic description, image quality and sample preservation. Always using freeware...
9.
Caltabiano P, Rosa P, de Campos K, Hein L
Microsc Res Tech
. 2012 Mar;
75(9):1155-8.
PMID: 22434578
The stretch zone width (SZW) data for 15-5PH steel CTOD specimens fractured at -150°C to + 23°C temperature were measured based on focused images and 3D maps obtained by extended...