K A Mkhoyan
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Explore the profile of K A Mkhoyan including associated specialties, affiliations and a list of published articles.
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Articles
9
Citations
26
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Recent Articles
1.
Newhouse-Illige T, Liu Y, Xu M, Reifsnyder Hickey D, Kundu A, Almasi H, et al.
Nat Commun
. 2017 May;
8:15232.
PMID: 28508882
Magnetic interlayer coupling is one of the central phenomena in spintronics. It has been predicted that the sign of interlayer coupling can be manipulated by electric fields, instead of electric...
2.
Mutlu Z, Wu R, Wickramaratne D, Shahrezaei S, Liu C, Temiz S, et al.
Small
. 2016 Apr;
12(22):2998-3004.
PMID: 27099950
Tin sulfides can exist in a variety of phases and polytypes due to the different oxidation states of Sn. A subset of these phases and polytypes take the form of...
3.
Ozatay O, Gowtham P, Tan K, READ J, Mkhoyan K, Thomas M, et al.
Nat Mater
. 2008 Jun;
7(7):567-73.
PMID: 18536721
The successful operation of spin-based data storage devices depends on thermally stable magnetic bits. At the same time, the data-processing speeds required by today's technology necessitate ultrafast switching in storage...
4.
Mkhoyan K, Maccagnano-Zacher S, Kirkland E, Silcox J
Ultramicroscopy
. 2008 Apr;
108(8):791-803.
PMID: 18374489
A study of high-resolution ADF imaging in uncorrected and aberration-corrected STEMs was carried out by multislice simulation. The presence of amorphous layers at the surface of a crystalline specimen is...
5.
Mkhoyan K, Maccagnano-Zacher S, Thomas M, Silcox J
Phys Rev Lett
. 2008 Feb;
100(2):025503.
PMID: 18232885
A semiquantitative correlation between experimental observations and theoretical prediction in electron microscopy is achieved. Experiments conducted on amorphous silicon in the convergent beam electron diffraction mode provide measurements of the...
6.
Maccagnano-Zacher S, Mkhoyan K, Kirkland E, Silcox J
Ultramicroscopy
. 2007 Dec;
108(8):718-26.
PMID: 18160220
A study of the effects of small-angle specimen tilt on high-resolution annular dark field images was carried out for scanning transmission electron microscopes with uncorrected and aberration-corrected probes using multislice...
7.
Mkhoyan K, Babinec T, Maccagnano S, Kirkland E, Silcox J
Ultramicroscopy
. 2006 Nov;
107(4-5):345-55.
PMID: 17074441
To identify major features in low electron energy loss spectra, the different excitations (bulk plasmons, interband transitions, surface plasmons, Cherenkov and surface guided modes) must be delineated from each other....
8.
Mkhoyan K, Silcox J, Ellison A, Ast D, Dieckmann R
Phys Rev Lett
. 2006 Jun;
96(20):205506.
PMID: 16803186
An unusually complete recovery of extensive electron-beam-induced damage in a thin film of a CaO-Al2O3-SiO2 glass was discovered. Nanoscale measurements show that the Ca ions migrate about 10 nm away...
9.
Mkhoyan K, Batson P, Cha J, Schaff W, Silcox J
Science
. 2006 Jun;
312(5778):1354.
PMID: 16741114
With current advances in sub-angstrom resolution scanning transmission electron microscopy (STEM), it is now possible to image directly local crystal structures of materials where dramatically different atoms are separated from...