MRI-Induced RF Heating of Deep Brain Stimulation Devices: In Vivo Predictions and Comparisons Between 0.55 T and 1.5 T

The prevailing view suggests low-field MRI is safer for patients with medical implants, but evidence is insufficient. Radiofrequency (RF) heating in elongated implants is complex, with many interacting factors influencing the outcome. Thus, deeming low-field MRI universally safe on scant data could endanger patient safety. This study evaluates RF heating of a commercial deep brain stimulation (DBS) implant during MRI at 0.55 T and 1.5 T through phantom measurements and transfer function prediction. Results demonstrate that 0.55 T MRI can induce critical RF heating levels in the implant, sometimes surpassing the heating at 1.5 T significantly. These findings highlight the necessity for device and patient-specific safety assessments before conducting 0.55 T MRI on patients with elongated medical implants.