Peter Hartel
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Explore the profile of Peter Hartel including associated specialties, affiliations and a list of published articles.
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9
Citations
52
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Recent Articles
1.
Sagawa R, Yasuhara A, Hashiguchi H, Naganuma T, Tanba S, Ishikawa T, et al.
Ultramicroscopy
. 2021 Dec;
233:113440.
PMID: 34920279
Ultimate resolution in scanning transmission electron microscopy (STEM) with state-of-the-art aberration correctors requires careful tuning of the experimental parameters. The optimum aperture semi-angle depends on the chosen high tension, the...
2.
Linck M, Hartel P, Uhlemann S, Kahl F, Muller H, Zach J, et al.
Phys Rev Lett
. 2016 Aug;
117(7):076101.
PMID: 27563976
Atomic resolution in transmission electron microscopy of thin and light-atom materials requires a rigorous reduction of the beam energy to reduce knockon damage. However, at the same time, the chromatic...
3.
Uhlemann S, Muller H, Hartel P, Zach J, Haider M
Phys Rev Lett
. 2013 Aug;
111(4):046101.
PMID: 23931384
The resolving power of an electron microscope is determined by the optics and the stability of the instrument. Recently, progress has been obtained towards subångström resolution at beam energies of...
4.
Alem N, Yazyev O, Kisielowski C, Denes P, Dahmen U, Hartel P, et al.
Phys Rev Lett
. 2011 Apr;
106(12):126102.
PMID: 21517331
Crystalline systems often lower their energy by atom displacements from regular high-symmetry lattice sites. We demonstrate that such symmetry lowering distortions can be visualized by ultrahigh resolution transmission electron microscopy...
5.
Erni R, Freitag B, Hartel P, Muller H, Tiemeijer P, van der Stam M, et al.
Microsc Microanal
. 2009 Oct;
12(6):492-7.
PMID: 19830941
Planar defects in a polycrystalline diamond film were studied by high-resolution transmission electron microscopy (HRTEM) and high-resolution scanning transmission electron microscopy (STEM). In both modes, sub-Angstrom resolution was achieved by...
6.
Muller H, Uhlemann S, Hartel P, Haider M
Microsc Microanal
. 2009 Oct;
12(6):442-55.
PMID: 19830935
Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in electron microscopy. We investigate the limits of the present design for the hexapole corrector with...
7.
Kabius B, Hartel P, Haider M, Muller H, Uhlemann S, Loebau U, et al.
J Electron Microsc (Tokyo)
. 2009 Apr;
58(3):147-55.
PMID: 19398781
Contrast-transfer calculations indicate that C(c) correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic...
8.
Sawada H, Tomita T, Naruse M, Honda T, Hambridge P, Hartel P, et al.
J Electron Microsc (Tokyo)
. 2005 Jun;
54(2):119-21.
PMID: 15972729
We have successfully developed a spherical aberration (Cs)-corrected electron microscope for probe- and image-forming systems using hexapole correctors. The performance of the microscope has been evaluated experimentally. The point resolution...
9.
Hosokawa F, Tomita T, Naruse M, Honda T, Hartel P, Haider M
J Electron Microsc (Tokyo)
. 2003 May;
52(1):3-10.
PMID: 12741482
A spherical aberration (Cs)-corrected 200 kV TEM was newly developed. The column of the microscope was extended by 25 cm and the inner yoke of the objective lens was modified...