Jonathan J P Peters
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Explore the profile of Jonathan J P Peters including associated specialties, affiliations and a list of published articles.
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Articles
22
Citations
168
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Recent Articles
1.
Peters J, Mullarkey T, Bekkevold J, Geever M, Ishikawa R, Shibata N, et al.
Ultramicroscopy
. 2024 Sep;
267:114056.
PMID: 39341013
Faster scanning in scanning transmission electron microscopy has long been desired for the ability to better control dose, minimise effects of environmental distortions, and to capture the dynamics of in-situ...
2.
Bekkevold J, Peters J, Ishikawa R, Shibata N, Jones L
Microsc Microanal
. 2024 Sep;
30(5):878-888.
PMID: 39270660
In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterization of a material's functional properties using in situ experiments are becoming more widely available. As the...
3.
Peters J, Reed B, Jimbo Y, Noguchi K, Muller K, Porter A, et al.
Science
. 2024 Aug;
385(6708):549-553.
PMID: 39088619
An ever-present limitation of transmission electron microscopy is the damage caused by high-energy electrons interacting with any sample. By reconsidering the fundamentals of imaging, we demonstrate an event-responsive approach to...
4.
Kusumi T, Katakami S, Ishikawa R, Kawahara K, Mullarkey T, Bekkevold J, et al.
Ultramicroscopy
. 2024 Jun;
264:113996.
PMID: 38885602
With the recent progress in the development of detectors in electron microscopy, it has become possible to directly count the number of electrons per pixel, even with a scintillator-type detector,...
5.
Peters J, Mullarkey T, Hedley E, Muller K, Porter A, Mostaed A, et al.
Nat Commun
. 2023 Aug;
14(1):5184.
PMID: 37626044
Transmission electron microscopy is a pivotal instrument in materials and biological sciences due to its ability to provide local structural and spectroscopic information on a wide range of materials. However,...
6.
Mullarkey T, Geever M, Peters J, Griffiths I, Nellist P, Jones L
Microsc Microanal
. 2023 Jul;
29(4):1402-1408.
PMID: 37488817
With increasing interest in high-speed imaging, there should be an increased interest in the response times of our scanning transmission electron microscope detectors. Previous works have highlighted and contrasted the...
7.
Peters J, Mullarkey T, Gott J, Nelson E, Jones L
Microsc Microanal
. 2023 Jul;
29(4):1373-1379.
PMID: 37488815
Fast frame rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in situ events, or reducing the appearance of scan distortions....
8.
Quigley F, McBean P, ODonovan P, Peters J, Jones L
Microsc Microanal
. 2022 Mar;
:1-7.
PMID: 35354509
Low-voltage transmission electron microscopy (≤80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can...
9.
Rusu D, Peters J, Hase T, Gott J, Nisbet G, Strempfer J, et al.
Nature
. 2022 Feb;
602(7896):240-244.
PMID: 35140385
Ferroics, especially ferromagnets, can form complex topological spin structures such as vortices and skyrmions when subjected to particular electrical and mechanical boundary conditions. Simple vortex-like, electric-dipole-based topological structures have been...
10.
Peters J
Ultramicroscopy
. 2021 Aug;
229:113364.
PMID: 34352601
Image simulation in electron microscopy is vital for advanced image analysis but can be prohibitively long. This is especially true when including thermal diffuse scattering through the frozen phonon method,...