Angle-resolved Photoelectron Spectroscopy in a Low-energy Electron Microscope

Overview

Journal Struct Dyn

Date 2024 Jan 1

PMID 38162194

Authors

Alexander Neuhaus

Pascal Dreher

Florian Schutz

Helder Marchetto

Torsten Franz

Frank Meyer Zu Heringdorf

Affiliations

Soon will be listed here.

Abstract

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes, the electron optics allow imaging of the image plane, momentum plane, or dispersive plane, depending on the lens setting. Furthermore, apertures allow filtering of energy-, real-, and momentum space. Here, we describe how a standard spectroscopic and low-energy electron microscope can be equipped with an additional slit at the entrance of the already present hemispherical analyzer to enable an angle- and energy-resolved photoemission mode with micrometer spatial selectivity. We apply a photogrammetric calibration to correct for image distortions of the projective system behind the analyzer and present spectra recorded on Au(111) as a benchmark. Our approach makes data acquisition in energy-momentum space more efficient, which is a necessity for laser-based pump-probe photoemission microscopy with femtosecond time resolution.

Citing Articles

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PMID: 40060919 PMC: 11888785. DOI: 10.1063/4.0000284.

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