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Deciphering the Genetic Architecture of Resistance to in Soybean ( L.) by Integrating Genome-wide Association Mapping and RNA-Seq Analysis

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Journal Front Plant Sci
Date 2023 Oct 13
PMID 37828935
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Abstract

Target spot caused by is a problematic disease in tropical and subtropical soybean () growing regions. Although resistant soybean genotypes have been identified, the genetic mechanisms underlying target spot resistance has not yet been studied. To address this knowledge gap, this is the first genome-wide association study (GWAS) conducted using the SoySNP50K array on a panel of 246 soybean accessions, aiming to unravel the genetic architecture of resistance. The results revealed significant associations of 14 and 33 loci with resistance to LIM01 and SSTA isolates, respectively, with six loci demonstrating consistent associations across both isolates. To identify potential candidate genes within GWAS-identified loci, dynamic transcriptome profiling was conducted through RNA-Seq analysis. The analysis involved comparing gene expression patterns between resistant and susceptible genotypes, utilizing leaf tissue collected at different time points after inoculation. Integrating results of GWAS and RNA-Seq analyses identified 238 differentially expressed genes within a 200 kb region encompassing significant quantitative trait loci (QTLs) for disease severity ratings. These genes were involved in defense response to pathogen, innate immune response, chitinase activity, histone H3-K9 methylation, salicylic acid mediated signaling pathway, kinase activity, and biosynthesis of flavonoid, jasmonic acid, phenylpropanoid, and wax. In addition, when combining results from this study with previous GWAS research, 11 colocalized regions associated with disease resistance were identified for biotic and abiotic stress. This finding provides valuable insight into the genetic resources that can be harnessed for future breeding programs aiming to enhance soybean resistance against target spot and other diseases simultaneously.

Citing Articles

Deciphering genetic factors contributing to enhanced resistance against Cercospora leaf blight in soybean ( L.) using GWAS analysis.

Patel J, Allen T, Buckley B, Chen P, Clubb M, Mozzoni L Front Genet. 2024; 15:1377223.

PMID: 38798696 PMC: 11116733. DOI: 10.3389/fgene.2024.1377223.

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