Fast Twist Angle Mapping of Bilayer Graphene Using Spectroscopic Ellipsometric Contrast Microscopy

Overview

Journal Nano Lett

Publisher American Chemical Society

Specialty Biotechnology

Date 2023 Jun 8

PMID 37289669

Authors

Teja Potocnik

Oliver Burton

Marcel Reutzel

David Schmitt

Jan Philipp Bange

Stefan Mathias

Fabian R Geisenhof

R Thomas Weitz

Linyuan Xin

Hannah J Joyce

Stephan Hofmann

Jack A Alexander-Webber

Affiliations

Soon will be listed here.

Abstract

Twisted bilayer graphene provides an ideal solid-state model to explore correlated material properties and opportunities for a variety of optoelectronic applications, but reliable, fast characterization of the twist angle remains a challenge. Here we introduce spectroscopic ellipsometric contrast microscopy (SECM) as a tool for mapping twist angle disorder in optically resonant twisted bilayer graphene. We optimize the ellipsometric angles to enhance the image contrast based on measured and calculated reflection coefficients of incident light. The optical resonances associated with van Hove singularities correlate well to Raman and angle-resolved photoelectron emission spectroscopy, confirming the accuracy of SECM. The results highlight the advantages of SECM, which proves to be a fast, nondestructive method for characterization of twisted bilayer graphene over large areas, unlocking process, material, and device screening and cross-correlative measurement potential for bilayer and multilayer materials.

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