Interface Atom Mobility and Charge Transfer Effects on CuO and CuO Formation on CuPd(111) and CuPt(111)

Overview

Journal Sci Rep

Specialty Science

Date 2021 Feb 16

PMID 33589680

Citations 1

Authors

Yasutaka Tsuda

Jessiel Siaron Gueriba

Takamasa Makino

Wilson Agerico Dino

Akitaka Yoshigoe

Michio Okada

Affiliations

Soon will be listed here.

Abstract

We bombarded [Formula: see text] and [Formula: see text] with a 2.3 eV hyperthermal oxygen molecular beam (HOMB) source, and characterized the corresponding (oxide) surfaces with synchrotron-radiation X-ray photoemission spectroscopy (SR-XPS). At [Formula: see text], CuO forms on both [Formula: see text] and [Formula: see text]. When we increase the surface temperature to [Formula: see text], [Formula: see text] also forms on [Formula: see text], but not on [Formula: see text]. For comparison, [Formula: see text] forms even at [Formula: see text] on Cu(111). On [Formula: see text], [Formula: see text] forms only after [Formula: see text], and no oxides can be found at [Formula: see text]. We ascribe this difference in Cu oxide formation to the mobility of the interfacial species (Cu/Pd/Pt) and charge transfer between the surface Cu oxides and subsurface species (Cu/Pd/Pt).

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