Equatorial Aberration of Powder Diffraction Data Collected with an Si Strip X-ray Detector by a Continuous-scan Integration Method

Overview

Journal J Appl Crystallogr

Date 2020 Jul 21

PMID 32684883

Citations 1

Authors

Takashi Ida

Affiliations

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Abstract

Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.

Citing Articles

Combining a multi-analyzer stage with a two-dimensional detector for high-resolution powder X-ray diffraction: correcting the angular scale.

Fitch A, Dejoie C J Appl Crystallogr. 2021; 54(Pt 4):1088-1099.

PMID: 34429720 PMC: 8366427. DOI: 10.1107/S1600576721005288.

References

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