Measurement of Sulfur L and Carbon K Edge XANES in a Polythiophene Film Using a High Harmonic Supercontinuum

Overview

Journal Struct Dyn

Date 2016 Nov 9

PMID 27822487

Citations 10

Authors

A S Johnson

L Miseikis

D A Wood

D R Austin

C Brahms

S Jarosch

C S Struber

P Ye

J P Marangos

Affiliations

Soon will be listed here.

Abstract

We use a high harmonic generated supercontinuum in the soft X-ray region to measure X-ray absorption near edge structure (XANES) spectra in polythiophene (poly(3-hexylthiophene)) films at multiple absorption edges. A few-cycle carrier-envelope phase-stable laser pulse centered at 1800 nm was used to generate a stable soft X-ray supercontinuum, with amplitude gating limiting the generated pulse duration to a single optical half-cycle. We report a quantitative transmission measurement of the sulfur edge over the range 160-200 eV and the carbon edge from 280 to 330 eV. These spectra show all the features previously reported in the XANES spectra of polythiophene, but for the first time they are measured with a source that has an approximately 1 fs pulse duration. This study opens the door to measurements that can fully time-resolve the photoexcited electronic dynamics in these systems.

Citing Articles

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