» Articles » PMID: 23722622

Near-field Ptychography: Phase Retrieval for Inline Holography Using a Structured Illumination

Overview
Journal Sci Rep
Specialty Science
Date 2013 Jun 1
PMID 23722622
Citations 31
Authors
Affiliations
Soon will be listed here.
Abstract

Inline holography is a common phase-contrast imaging method which uses free-space propagation to encode the phase signal into measured intensities. However, quantitative retrieval of the sample's image remains challenging, imposing constraints on the nature of the sample or on the propagation distance. Here, we present a way of simultaneously retrieving the sample's complex-valued transmission function and the incident illumination function from near-field diffraction patterns. The procedure relies on the measurement diversity created by lateral translations of the sample with respect to a structured illumination. The reconstruction approach, in essence identical to that employed in ptychography, is applied to hard X-ray synchrotron measurements and to simulations. Compared to other inline holography techniques, we expect near-field ptychography to reduce reconstruction artefacts by factoring out wavefront imperfections and relaxing constraints on the sample's scattering properties, thus ultimately improving the robustness of propagation-based X-ray phase tomography.

Citing Articles

ssc-cdi: A Memory-Efficient, Multi-GPU Package for Ptychography with Extreme Data.

Tonin Y, Peixinho A, Brandao-Junior M, Ferraz P, Miqueles E J Imaging. 2024; 10(11).

PMID: 39590749 PMC: 11595696. DOI: 10.3390/jimaging10110286.


Near-field electron ptychography using full-field structured illumination.

Tamaki H, Saitoh K Microscopy (Oxf). 2024; 74(1):10-19.

PMID: 39049512 PMC: 11781274. DOI: 10.1093/jmicro/dfae035.


Ptycho-endoscopy on a lensless ultrathin fiber bundle tip.

Song P, Wang R, Loetgering L, Liu J, Vouras P, Lee Y Light Sci Appl. 2024; 13(1):168.

PMID: 39019852 PMC: 11255264. DOI: 10.1038/s41377-024-01510-5.


Lens-free reflective topography for high-resolution wafer inspection.

Lee H, Sung J, Park S, Shin J, Kim H, Kim W Sci Rep. 2024; 14(1):10519.

PMID: 38714707 PMC: 11076508. DOI: 10.1038/s41598-024-59496-4.


High-resolution and sensitivity bi-directional x-ray phase contrast imaging using 2D Talbot array illuminators.

Gustschin A, Riedel M, Taphorn K, Petrich C, Gottwald W, Noichl W Optica. 2023; 8(12):1588-1595.

PMID: 37829605 PMC: 10567101. DOI: 10.1364/OPTICA.441004.


References
1.
Maiden A, Rodenburg J . An improved ptychographical phase retrieval algorithm for diffractive imaging. Ultramicroscopy. 2009; 109(10):1256-62. DOI: 10.1016/j.ultramic.2009.05.012. View

2.
Weitkamp T, Diaz A, David C, Pfeiffer F, Stampanoni M, Cloetens P . X-ray phase imaging with a grating interferometer. Opt Express. 2009; 13(16):6296-304. DOI: 10.1364/opex.13.006296. View

3.
Nugent , Gureyev , Cookson , Paganin , Barnea . Quantitative Phase Imaging Using Hard X Rays. Phys Rev Lett. 1996; 77(14):2961-2964. DOI: 10.1103/PhysRevLett.77.2961. View

4.
Rodenburg J, Hurst A, Cullis A, Dobson B, Pfeiffer F, Bunk O . Hard-x-ray lensless imaging of extended objects. Phys Rev Lett. 2007; 98(3):034801. DOI: 10.1103/PhysRevLett.98.034801. View

5.
Maiden A, Humphry M, Zhang F, Rodenburg J . Superresolution imaging via ptychography. J Opt Soc Am A Opt Image Sci Vis. 2011; 28(4):604-12. DOI: 10.1364/JOSAA.28.000604. View