Coherent X-ray Diffraction Imaging of Strain at the Nanoscale

Overview

Journal Nat Mater

Date 2009 Mar 25

PMID 19308088

Citations 108

Authors

Ian Robinson

Ross Harder

Affiliations

Soon will be listed here.

Abstract

The understanding and management of strain is of fundamental importance in the design and implementation of materials. The strain properties of nanocrystalline materials are different from those of the bulk because of the strong influence of their surfaces and interfaces, which can be used to augment their function and introduce desirable characteristics. Here we explain how new X-ray diffraction techniques, which take advantage of the latest synchrotron radiation sources, can be used to obtain quantitative three-dimensional images of strain. These methods will lead, in the near future, to new knowledge of how nanomaterials behave within active devices and on unprecedented timescales.

Citing Articles

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Single-shot X-ray imaging of two-dimensional strain fields in colloidal crystals.

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Operando real-space imaging of a structural phase transformation in the high-voltage electrode LiNiMnO.

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Imaging of electric-field-induced domain structure in DyMnO nanocrystals.

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