Strong Anomalous Optical Dispersion of Graphene: Complex Refractive Index Measured by Picometrology

Overview

Journal Opt Express

Specialties Biophysics
Ophthalmology

Date 2008 Dec 24

PMID 19104646

Citations 11

Authors

Xuefeng Wang

Yong P Chen

David D Nolte

Affiliations

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Abstract

We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg = 2.4-1.0i at 532 nm to ñg = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm).

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