X-ray Diffuse Scattering Measurements of Nucleation Dynamics at Femtosecond Resolution

Overview

Journal Phys Rev Lett

Publisher American Physical Society

Specialty Biophysics

Date 2008 Jun 4

PMID 18517965

Citations 9

Authors

A M Lindenberg

S Engemann

K J Gaffney

K Sokolowski-Tinten

J Larsson

P B Hillyard

D A Reis

D M Fritz

J Arthur

R A Akre

M J George

A Deb

P H Bucksbaum

J Hajdu

D A Meyer

M Nicoul

C Blome

Th Tschentscher

A L Cavalieri

R W Falcone

S H Lee

R Pahl

J Rudati

P H Fuoss

A J Nelson

P Krejcik

D P Siddons

P Lorazo

J B Hastings

Affiliations

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Abstract

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

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